Kód HS/KN 90278095 je pro přípravu na EUDR mimo oblast působnosti.
Non-electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or associated insulating or conductive layers during the semiconductor wafer production process Indexovaný nástroj oblasti působnosti vrací pro tento kód výsledek Out of scope. No Annex I scope match was found for this indexed CN code.
Proč tato referenční stránka dává právě tuto odpověď.
- Popis kódu
- Non-electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or associated insulating or conductive layers during the semiconductor wafer production process
- Základ v příloze I
- Bez přímé položky v příloze I
- Zdrojový základ
- Regulation (EU) 2023/1115 Annex I and CN 2026 index
Nadřazené, podřazené a sousední řádky.
Knihovní zobrazení slouží k referenční navigaci. Chcete-li spustit další kód jako akci, použijte kontrolu.
90optické, fotografické, kinematografické, měřicí, kontrolní, přesné, lékařské nebo chirurgické nástroje a přístroje; jejich části, součásti a příslušenstvíout9027instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus; instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters; microtomesout902780instruments and apparatus for physical or chemical analysis, or for measuring or checking viscosity, porosity, expansion, surface tension or the like, or for measuring or checking quantities of heat, sound or light, n.e.s.out90278005exposure metersout90278011electronic ph meters, rh meters and other apparatus for measuring conductivityout90278013electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or of lcd substrates or associated insulating or conductive layers during the semiconductor wafer production process or the lcd production processout90278015electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or associated insulating or conductive layers during the semiconductor wafer production processout90278016electronic apparatus for performing measurements of the physical properties of lcd substrates or associated insulating or conducting layers during the lcd production processout90278017electronic instruments and apparatus for physical or chemical analysis or for measuring viscosity, porosity, expansion, surface tension or the like, or for measuring heat, sound or light, n.e.s.out
Co to znamená pro přípravu.
Tento řádek není v aktuálním výsledku oblasti působnosti přímým spouštěčem shromažďování dokladů.
Regulation (EU) 2023/1115 Annex I — relevant productsstaženo 2026-08-06Commission Delegated Regulation (EU) 2026/2102 amending Annex I to Regulation (EU) 2023/1115staženo 2026-09-24Eurostat Comext Combined Nomenclature codelist (CXT_NC v11.0)staženo 2026-08-06Eurostat Comext partner country codelist (CXT_FREE_ISO)staženo 2026-08-06Eurostat Comext DS-045409 — EU trade since 1988 by HS2-4-6 and CN8staženo 2026-08-06Commission Implementing Regulation (EU) 2025/1093 — country benchmarkingstaženo 2026-08-06Regulation (EU) 2025/2650 amending Regulation (EU) 2023/1115 as regards certain obligations of operators and tradersstaženo 2025-12-26Commission Implementing Regulation (EU) 2026/1565 amending Implementing Regulation (EU) 2024/3084 (EUDR information system)staženo 2026-08-08