HS/KN-kode 90278013 er ikke omfattet til EUDR-forberedelse.
Electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or of LCD substrates or associated insulating or conductive layers during the semiconductor wafer production process or the LCD production process Den indekserede anvendelsesområde-motor returnerer Out of scope for denne kode. No Annex I scope match was found for this indexed CN code.
Hvorfor denne referenceside giver dette svar.
- Kodebeskrivelse
- Electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or of LCD substrates or associated insulating or conductive layers during the semiconductor wafer production process or the LCD production process
- Bilag I-grundlag
- Ingen direkte bilag I-post
- Kildegrundlag
- Regulation (EU) 2023/1115 Annex I and CN 2026 index
Overordnet, underordnet og nærliggende rækker.
Biblioteksvisningen er til referencenavigation. Brug tjekkeren, når du vil køre en anden kode som en handling.
90optiske, fotografiske og kinematografiske instrumenter og apparater; måle-, kontrol- og præcisionsinstrumenter og -apparater; medicinske og kirurgiske instrumenter og apparater; dele og tilbehør dertilout9027instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus; instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters; microtomesout902780instruments and apparatus for physical or chemical analysis, or for measuring or checking viscosity, porosity, expansion, surface tension or the like, or for measuring or checking quantities of heat, sound or light, n.e.s.out90278005exposure metersout90278011electronic ph meters, rh meters and other apparatus for measuring conductivityout90278015electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or associated insulating or conductive layers during the semiconductor wafer production processout90278016electronic apparatus for performing measurements of the physical properties of lcd substrates or associated insulating or conducting layers during the lcd production processout90278017electronic instruments and apparatus for physical or chemical analysis or for measuring viscosity, porosity, expansion, surface tension or the like, or for measuring heat, sound or light, n.e.s.out90278018electronic instruments and apparatus for physical or chemical analysis or for measuring viscosity, porosity, expansion, surface tension or the like, or for measuring heat, sound or light, n.e.s.out
Hvad dette betyder for forberedelsen.
Denne række udløser ikke direkte indsamling af dokumentation i det aktuelle anvendelsesområde-resultat.
Regulation (EU) 2023/1115 Annex I — relevant productshentet 2026-08-06Commission Delegated Regulation (EU) 2026/2102 amending Annex I to Regulation (EU) 2023/1115hentet 2026-09-24Eurostat Comext Combined Nomenclature codelist (CXT_NC v11.0)hentet 2026-08-06Eurostat Comext partner country codelist (CXT_FREE_ISO)hentet 2026-08-06Eurostat Comext DS-045409 — EU trade since 1988 by HS2-4-6 and CN8hentet 2026-08-06Commission Implementing Regulation (EU) 2025/1093 — country benchmarkinghentet 2026-08-06Regulation (EU) 2025/2650 amending Regulation (EU) 2023/1115 as regards certain obligations of operators and tradershentet 2025-12-26Commission Implementing Regulation (EU) 2026/1565 amending Implementing Regulation (EU) 2024/3084 (EUDR information system)hentet 2026-08-08