HS-/KN-Code 90278093 ist für die EUDR-Vorbereitung außerhalb des Geltungsbereichs.
Apparatus and equipment for performing measurements of the physical properties of semiconductor materials or of LCD substrates or associated insulating or conductive layers during the semiconductor wafer production process or the LCD production process, non-electronic Die indexierte Scope-Engine liefert für diesen Code das Ergebnis Out of scope. No Annex I scope match was found for this indexed CN code.
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- Code-Beschreibung
- Apparatus and equipment for performing measurements of the physical properties of semiconductor materials or of LCD substrates or associated insulating or conductive layers during the semiconductor wafer production process or the LCD production process, non-electronic
- Anhang-I-Grundlage
- Kein direkter Anhang-I-Eintrag
- Quellengrundlage
- Regulation (EU) 2023/1115 Annex I and CN 2026 index
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90optische, fotografische oder kinematografische instrumente, apparate und geräte; mess-, prüf- oder präzisionsinstrumente, -apparate und -geräte; medizinische und chirurgische instrumente, apparate und geräte; teile und zubehör für diese instrumente, apparate und geräteout9027instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus; instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters; microtomesout902780instruments and apparatus for physical or chemical analysis, or for measuring or checking viscosity, porosity, expansion, surface tension or the like, or for measuring or checking quantities of heat, sound or light, n.e.s.out90278005exposure metersout90278011electronic ph meters, rh meters and other apparatus for measuring conductivityout90278013electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or of lcd substrates or associated insulating or conductive layers during the semiconductor wafer production process or the lcd production processout90278015electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or associated insulating or conductive layers during the semiconductor wafer production processout90278016electronic apparatus for performing measurements of the physical properties of lcd substrates or associated insulating or conducting layers during the lcd production processout90278017electronic instruments and apparatus for physical or chemical analysis or for measuring viscosity, porosity, expansion, surface tension or the like, or for measuring heat, sound or light, n.e.s.out
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Regulation (EU) 2023/1115 Annex I — relevant productsabgerufen am 2026-08-06Commission Delegated Regulation (EU) 2026/2102 amending Annex I to Regulation (EU) 2023/1115abgerufen am 2026-09-24Eurostat Comext Combined Nomenclature codelist (CXT_NC v11.0)abgerufen am 2026-08-06Eurostat Comext partner country codelist (CXT_FREE_ISO)abgerufen am 2026-08-06Eurostat Comext DS-045409 — EU trade since 1988 by HS2-4-6 and CN8abgerufen am 2026-08-06Commission Implementing Regulation (EU) 2025/1093 — country benchmarkingabgerufen am 2026-08-06Regulation (EU) 2025/2650 amending Regulation (EU) 2023/1115 as regards certain obligations of operators and tradersabgerufen am 2025-12-26Commission Implementing Regulation (EU) 2026/1565 amending Implementing Regulation (EU) 2024/3084 (EUDR information system)abgerufen am 2026-08-08