HS/KN-kood 90278093 on EUDR-i ettevalmistuse seisukohast kohaldamisalast väljas.
Apparatus and equipment for performing measurements of the physical properties of semiconductor materials or of LCD substrates or associated insulating or conductive layers during the semiconductor wafer production process or the LCD production process, non-electronic Indekseeritud kohaldamisala mootor tagastab selle koodi kohta tulemuse Out of scope. No Annex I scope match was found for this indexed CN code.
Miks see teatmeleht annab sellise vastuse.
- Koodi kirjeldus
- Apparatus and equipment for performing measurements of the physical properties of semiconductor materials or of LCD substrates or associated insulating or conductive layers during the semiconductor wafer production process or the LCD production process, non-electronic
- I lisa alus
- Otsene I lisa kanne puudub
- Allika alus
- Regulation (EU) 2023/1115 Annex I and CN 2026 index
Üle-, alam- ja lähedased read.
Teatmiku vaade on mõeldud teatmeandmetes liikumiseks. Kui soovite toiminguna kontrollida mõnda muud koodi, kasutage kontrolli tööriista.
90optika-, foto-, kino-, mõõte-, kontroll-, täppis-, meditsiini- ja kirurgiainstrumendid ning -aparatuur; nende osad ja tarvikudout9027instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus; instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters; microtomesout902780instruments and apparatus for physical or chemical analysis, or for measuring or checking viscosity, porosity, expansion, surface tension or the like, or for measuring or checking quantities of heat, sound or light, n.e.s.out90278005exposure metersout90278011electronic ph meters, rh meters and other apparatus for measuring conductivityout90278013electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or of lcd substrates or associated insulating or conductive layers during the semiconductor wafer production process or the lcd production processout90278015electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or associated insulating or conductive layers during the semiconductor wafer production processout90278016electronic apparatus for performing measurements of the physical properties of lcd substrates or associated insulating or conducting layers during the lcd production processout90278017electronic instruments and apparatus for physical or chemical analysis or for measuring viscosity, porosity, expansion, surface tension or the like, or for measuring heat, sound or light, n.e.s.out
Mida see ettevalmistuse jaoks tähendab.
See rida ei käivita praeguse kohaldamisala tulemuse kohaselt otseselt tõendite kogumist.
Regulation (EU) 2023/1115 Annex I — relevant productshangitud 2026-08-06Commission Delegated Regulation (EU) 2026/2102 amending Annex I to Regulation (EU) 2023/1115hangitud 2026-09-24Eurostat Comext Combined Nomenclature codelist (CXT_NC v11.0)hangitud 2026-08-06Eurostat Comext partner country codelist (CXT_FREE_ISO)hangitud 2026-08-06Eurostat Comext DS-045409 — EU trade since 1988 by HS2-4-6 and CN8hangitud 2026-08-06Commission Implementing Regulation (EU) 2025/1093 — country benchmarkinghangitud 2026-08-06Regulation (EU) 2025/2650 amending Regulation (EU) 2023/1115 as regards certain obligations of operators and tradershangitud 2025-12-26Commission Implementing Regulation (EU) 2026/1565 amending Implementing Regulation (EU) 2024/3084 (EUDR information system)hangitud 2026-08-08