HS/CN-koodi 90278095 on soveltamisalan ulkopuolella EUDR-valmistelun kannalta.
Non-electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or associated insulating or conductive layers during the semiconductor wafer production process Indeksoitu soveltamisalamoottori palauttaa arvon Out of scope tälle koodille. No Annex I scope match was found for this indexed CN code.
Miksi tämä hakemistosivu antaa tämän vastauksen.
- Koodin kuvaus
- Non-electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or associated insulating or conductive layers during the semiconductor wafer production process
- Liite I -peruste
- Ei suoraa liite I -merkintää
- Lähdeperuste
- Regulation (EU) 2023/1115 Annex I and CN 2026 index
Yläkoodi, alakoodit ja lähirivit.
Kirjastonäkymä on tarkoitettu viitenavigointiin. Käytä tarkistinta, kun haluat suorittaa toisen koodin toimintona.
90ryhmä - optiset, valokuvaus-, elokuva-, mittaus-, tarkistus-, tarkkuus-, lääketieteelliset tai kirurgiset kojeet ja laitteet; niiden osat ja tarvikkeetout9027instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus; instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters; microtomesout902780instruments and apparatus for physical or chemical analysis, or for measuring or checking viscosity, porosity, expansion, surface tension or the like, or for measuring or checking quantities of heat, sound or light, n.e.s.out90278005exposure metersout90278011electronic ph meters, rh meters and other apparatus for measuring conductivityout90278013electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or of lcd substrates or associated insulating or conductive layers during the semiconductor wafer production process or the lcd production processout90278015electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or associated insulating or conductive layers during the semiconductor wafer production processout90278016electronic apparatus for performing measurements of the physical properties of lcd substrates or associated insulating or conducting layers during the lcd production processout90278017electronic instruments and apparatus for physical or chemical analysis or for measuring viscosity, porosity, expansion, surface tension or the like, or for measuring heat, sound or light, n.e.s.out
Mitä tämä tarkoittaa valmistelun kannalta.
Tämä rivi ei ole suora näytönkeruun laukaisin nykyisessä soveltamisalatuloksessa.
Regulation (EU) 2023/1115 Annex I — relevant productshaettu 2026-08-06Commission Delegated Regulation (EU) 2026/2102 amending Annex I to Regulation (EU) 2023/1115haettu 2026-09-24Eurostat Comext Combined Nomenclature codelist (CXT_NC v11.0)haettu 2026-08-06Eurostat Comext partner country codelist (CXT_FREE_ISO)haettu 2026-08-06Eurostat Comext DS-045409 — EU trade since 1988 by HS2-4-6 and CN8haettu 2026-08-06Commission Implementing Regulation (EU) 2025/1093 — country benchmarkinghaettu 2026-08-06Regulation (EU) 2025/2650 amending Regulation (EU) 2023/1115 as regards certain obligations of operators and tradershaettu 2025-12-26Commission Implementing Regulation (EU) 2026/1565 amending Implementing Regulation (EU) 2024/3084 (EUDR information system)haettu 2026-08-08