Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.

HS/CN oznaka 90319020 je izvan područja primjene za EUDR pripremu.

Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. Indeksirani motor za provjeru područja primjene za ovu oznaku vraća Out of scope. No Annex I scope match was found for this indexed CN code.

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Opis oznake

Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.

Osnova iz Priloga I

Nema izravnog unosa u Prilogu I

Izvorna osnova

Regulation (EU) 2023/1115 Annex I and CN 2026 index

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