HS/KN kods 90278093 EUDR sagatavošanas nolūkā: neietilpst darbības jomā.
Apparatus and equipment for performing measurements of the physical properties of semiconductor materials or of LCD substrates or associated insulating or conductive layers during the semiconductor wafer production process or the LCD production process, non-electronic Indeksētais darbības jomas dzinējs šim kodam atgriež Out of scope. No Annex I scope match was found for this indexed CN code.
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- Koda apraksts
- Apparatus and equipment for performing measurements of the physical properties of semiconductor materials or of LCD substrates or associated insulating or conductive layers during the semiconductor wafer production process or the LCD production process, non-electronic
- I pielikuma pamats
- Nav tieša I pielikuma ieraksta
- Avota pamats
- Regulation (EU) 2023/1115 Annex I and CN 2026 index
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90optical, photographic, cinematographic, measuring, checking, precision, medical or surgical instruments and apparatus; parts and accessories thereofout9027instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus; instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters; microtomesout902780instruments and apparatus for physical or chemical analysis, or for measuring or checking viscosity, porosity, expansion, surface tension or the like, or for measuring or checking quantities of heat, sound or light, n.e.s.out90278005exposure metersout90278011electronic ph meters, rh meters and other apparatus for measuring conductivityout90278013electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or of lcd substrates or associated insulating or conductive layers during the semiconductor wafer production process or the lcd production processout90278015electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or associated insulating or conductive layers during the semiconductor wafer production processout90278016electronic apparatus for performing measurements of the physical properties of lcd substrates or associated insulating or conducting layers during the lcd production processout90278017electronic instruments and apparatus for physical or chemical analysis or for measuring viscosity, porosity, expansion, surface tension or the like, or for measuring heat, sound or light, n.e.s.out
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Regulation (EU) 2023/1115 Annex I — relevant productsiegūts 2026-08-06Commission Delegated Regulation (EU) 2026/2102 amending Annex I to Regulation (EU) 2023/1115iegūts 2026-09-24Eurostat Comext Combined Nomenclature codelist (CXT_NC v11.0)iegūts 2026-08-06Eurostat Comext partner country codelist (CXT_FREE_ISO)iegūts 2026-08-06Eurostat Comext DS-045409 — EU trade since 1988 by HS2-4-6 and CN8iegūts 2026-08-06Commission Implementing Regulation (EU) 2025/1093 — country benchmarkingiegūts 2026-08-06Regulation (EU) 2025/2650 amending Regulation (EU) 2023/1115 as regards certain obligations of operators and tradersiegūts 2025-12-26Commission Implementing Regulation (EU) 2026/1565 amending Implementing Regulation (EU) 2024/3084 (EUDR information system)iegūts 2026-08-08