Il-kodiċi HS/NM 90278093 huwa barra mill-kamp ta’ applikazzjoni għat-tħejjija għall-EUDR.
Apparatus and equipment for performing measurements of the physical properties of semiconductor materials or of LCD substrates or associated insulating or conductive layers during the semiconductor wafer production process or the LCD production process, non-electronic Il-magna indiċizzata tal-kamp ta’ applikazzjoni tagħti Out of scope għal dan il-kodiċi. No Annex I scope match was found for this indexed CN code.
Għaliex din il-paġna ta’ referenza tagħti dik it-tweġiba.
- Deskrizzjoni tal-kodiċi
- Apparatus and equipment for performing measurements of the physical properties of semiconductor materials or of LCD substrates or associated insulating or conductive layers during the semiconductor wafer production process or the LCD production process, non-electronic
- Bażi fl-Anness I
- L-ebda entrata diretta fl-Anness I
- Bażi tas-sors
- Regulation (EU) 2023/1115 Annex I and CN 2026 index
Ringieli ġenituri, subordinati u viċini.
Il-veduta tal-librerija hija għan-navigazzjoni ta’ referenza. Uża l-verifikatur meta trid tiċċekkja kodiċi ieħor bħala azzjoni.
90strumenti u apparat ottiku, fotografiku, ċinematografiku, għall-kejl, għall-iċċekkjar, ta’ preċiżjoni, mediku jew kirurġiku; parts u aċċessorji tagħhomout9027instruments and apparatus for physical or chemical analysis, e.g. polarimeters, refractometers, spectrometers, gas or smoke analysis apparatus; instruments and apparatus for measuring or checking viscosity, porosity, expansion, surface tension or the like; instruments and apparatus for measuring or checking quantities of heat, sound or light, incl. exposure meters; microtomesout902780instruments and apparatus for physical or chemical analysis, or for measuring or checking viscosity, porosity, expansion, surface tension or the like, or for measuring or checking quantities of heat, sound or light, n.e.s.out90278005exposure metersout90278011electronic ph meters, rh meters and other apparatus for measuring conductivityout90278013electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or of lcd substrates or associated insulating or conductive layers during the semiconductor wafer production process or the lcd production processout90278015electronic apparatus and equipment for performing measurements of the physical properties of semiconductor materials or associated insulating or conductive layers during the semiconductor wafer production processout90278016electronic apparatus for performing measurements of the physical properties of lcd substrates or associated insulating or conducting layers during the lcd production processout90278017electronic instruments and apparatus for physical or chemical analysis or for measuring viscosity, porosity, expansion, surface tension or the like, or for measuring heat, sound or light, n.e.s.out
Xi jfisser dan għat-tħejjija.
Din ir-ringiela mhijiex skattatur dirett għall-ġbir tal-evidenza fir-riżultat attwali tal-kamp ta’ applikazzjoni.
Regulation (EU) 2023/1115 Annex I — relevant productsmiksub fi 2026-08-06Commission Delegated Regulation (EU) 2026/2102 amending Annex I to Regulation (EU) 2023/1115miksub fi 2026-09-24Eurostat Comext Combined Nomenclature codelist (CXT_NC v11.0)miksub fi 2026-08-06Eurostat Comext partner country codelist (CXT_FREE_ISO)miksub fi 2026-08-06Eurostat Comext DS-045409 — EU trade since 1988 by HS2-4-6 and CN8miksub fi 2026-08-06Commission Implementing Regulation (EU) 2025/1093 — country benchmarkingmiksub fi 2026-08-06Regulation (EU) 2025/2650 amending Regulation (EU) 2023/1115 as regards certain obligations of operators and tradersmiksub fi 2025-12-26Commission Implementing Regulation (EU) 2026/1565 amending Implementing Regulation (EU) 2024/3084 (EUDR information system)miksub fi 2026-08-08