Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.

Il-kodiċi HS/NM 90319020 huwa barra mill-kamp ta’ applikazzjoni għat-tħejjija għall-EUDR.

Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. Il-magna indiċizzata tal-kamp ta’ applikazzjoni tagħti Out of scope għal dan il-kodiċi. No Annex I scope match was found for this indexed CN code.

Għaliex din il-paġna ta’ referenza tagħti dik it-tweġiba.

Deskrizzjoni tal-kodiċi

Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.

Bażi fl-Anness I

L-ebda entrata diretta fl-Anness I

Bażi tas-sors

Regulation (EU) 2023/1115 Annex I and CN 2026 index

Ringieli ġenituri, subordinati u viċini.

Il-veduta tal-librerija hija għan-navigazzjoni ta’ referenza. Uża l-verifikatur meta trid tiċċekkja kodiċi ieħor bħala azzjoni.

Xi jfisser dan għat-tħejjija.

Din ir-ringiela mhijiex skattatur dirett għall-ġbir tal-evidenza fir-riżultat attwali tal-kamp ta’ applikazzjoni.