Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.

Koda HS/CN 90319020 je za pripravo na EUDR izven področja uporabe.

Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s. Indeksirani mehanizem za področje uporabe za to kodo vrne Out of scope. No Annex I scope match was found for this indexed CN code.

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Opis kode

Parts and accessories for optical instruments and appliances for inspecting semiconductor wafers or devices or for inspecting photomasks or reticles used in manufacturing semiconductor devices or for measuring surface particulate contamination on semiconductor wafers, n.e.s.

Podlaga v Prilogi I

Ni neposrednega vnosa v Prilogi I

Izvorna podlaga

Regulation (EU) 2023/1115 Annex I and CN 2026 index

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