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Biblioteca de ámbito SA/NC
Referencia de códigoreactores nucleares, calderas, máquinas, aparatos y artefactos mecánicos; partes de estas máquinas o aparatos

Focused ion beam milling machines for producing or repairing masks and reticles for patterns on semiconductor devices

Referencia con fecha de fuente para el código SA/NC 84569010, su base de ámbito EUDR, la jerarquía NC, las implicaciones en materia de pruebas y las filas indexadas relacionadas.

Tipo de referenciaFicha de ámbito SA/NC
Decisión de ámbitoOut of scope
Implicación para el importadorSolo nota de referencia
Año NC2026
Respuesta de referencia

El código SA/NC 84569010 se considera fuera del ámbito para la preparación EUDR.

Focused ion beam milling machines for producing or repairing masks and reticles for patterns on semiconductor devices El motor de ámbito indexado devuelve Out of scope para este código. No Annex I scope match was found for this indexed CN code.

Base del ámbito

Por qué esta página de referencia da esa respuesta.

Descripción del código
Focused ion beam milling machines for producing or repairing masks and reticles for patterns on semiconductor devices
Base en el anexo I
Sin entrada directa en el anexo I
Base de la fuente
Regulation (EU) 2023/1115 Annex I and CN 2026 index
Jerarquía NC

Filas superiores, inferiores y próximas.

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84reactores nucleares, calderas, máquinas, aparatos y artefactos mecánicos; partes de estas máquinas o aparatosout8456machine tools for working any material by removal of material, by laser or other light or photon beam, ultrasonic, electro-discharge, electro-chemical, electron beam, ionic-beam or plasma arc processes; water-jet cutting machines (excl. cleaning apparatus operated by ultrasonic processes, soldering and welding machines, incl. those which can be used for cutting, and material testing machines)out845690machine tools for working any material by removal of material, operated by electro-chemical, electron beam or ionic-beam processes (excl. soldering and welding machines, material testing machines and machines for the manufacture of semiconductor devices or of electronic integrated circuits)(2007-2500);machine-tools for working any material by removal of material, operated by electro-chemical, electron beam, ionic-beam or plasma arc process (excl. soldering and welding machines, incl. those which can be used for cutting, and material testing machines)(1988-1995)out84569000machine tools for working any material by removal of material, operated by electro-chemical, electron beam or ionic-beam processes (excl. soldering and welding machines, material testing machines and machines for the manufacture of semiconductor devices or of electronic integrated circuits)(2017-2500);machine tools for working any material by removal of material, operated by electro-chemical processes or electron beam, ion beam or plasma arc processes (excl. for soldering and welding machines, materials testing machines and machines for the manufacture of semiconductor devices or of electronic integrated circuits)(2007-2011);machine-tools for working any material by removal of material, operated by electro-chemical, electron beam, ionic-beam or plasma arc processes (excl. soldering and welding machines, incl. those which can be used for cutting, and material testing machines)(1988-1994)out84569020water-jet cutting machinesout84569030machine tools for dry etching, stripping or cleaning semiconductor wafersout84569080machine tools for working any material by removal of material, operated by electro-chemical processes or electron beam, ion beam or plasma arc processes (excl. for soldering and welding machines, materials testing machines and machines for the manufacture of semiconductor devices or of electronic integrated circuits)out84569090machine tools for working any material by removal of any material by electro-chemical processes or electron beam, ion beam or plasma arc processes (excl. for soldering and welding machines, materials testing machines, focused ion beam milling machines for producing or repairing masks and reticles for patterns on semiconductor devices, and machine tools for dry etching, stripping or cleaning semiconductor wafers)out
Patrón de pruebas

Qué significa esto para la preparación.

Esta fila no activa directamente la recogida de pruebas en el resultado de ámbito actual.

Metadatos de fuente
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84569010 — referencia de ámbito SA/NC del EUDR | EUDR Tools